Frontier Semiconductor, FSM, was founded in 1988. It offers a range of advanced metrology products and solutions for semiconductor and MEMS applications, including measurement systems for film stress, wafer bow, local stress & strain in Si, SiGe and SOI using Raman Spectroscopy, characterization techniques for new films, such as Thermal Desorption Spectroscopy, Quantitative Adhesion Testers, Ultra-thin Wafer Substrate. Systems are supported globally by FSM sales and service team. FSM cordially invites you to visit us at Semicon China 2007. If you have any enquiry, please contact FSM.
199 River Oaks Parkway, San Jose CA 95134
Phone : +1 408 432 8838
Fax: +1 408 432 8830 |
